EP3574526
MULTIPLE GATE-INDUCED DRAIN LEAKAGE CURRENT GENERATOR
Anmelder
MICRON TECHNOLOGY INC [US]Micron Technology, Inc.
Erfinder
SAITO MASANOBU [JP]TANAKA SHUJI [JP]SATO SHINJI [JP]SAITO, MasanobuTANAKA, ShujiSATO, Shinji
Externe Quellen
Klassifikation
IPC-Klassen
H01L 27/12H10B 41/27H10B 41/35H10B 43/35H10B 43/27H10W 20/43G11C 16/04G11C 16/16
CPC-Klassen
G11C 16/0483G11C 16/14G11C 16/16G11C 16/26H10B 41/27H10B 41/35H10B 43/27H10B 43/35H10D 86/0231H10D 86/40H10W 20/42H10W 20/43G11C 16/10G11C 16/30
AI: Semiconductors