EP3065184

TRENCH PROCESS AND STRUCTURE FOR BACKSIDE CONTACT SOLAR CELLS WITH POLYSILICON DOPED REGIONS

pending
JurisdiktionEP
Anmeldedatum29. Apr. 2009
Erteilungsdatum09. Feb. 2024
Veröffentlichungsnr.EP3065184
Anmeldenr.EP16165135
UPC-Verfahren3

Zusammenfassung

[0001] A solar cell includes polysilicon P-type and N-type doped regions on a backside (106) of a substrate (103), such as a silicon wafer. A trench structure (104) separates the P-type doped region (101) from the N-type doped region (102). Each of the P-type and N-type doped regions may be formed over a thin dielectric layer (113). The trench structure (104) may include a textured surface (114) for increased solar radiation collection. Among other advantages, the resulting structure increases efficiency by providing isolation between adjacent P-type and N-type doped regions, thereby preventing recombination in a space charge region where the doped regions would have touched.

Anmelder

SUNPOWER CORP [US]MAXEON SOLAR PTE LTD [SG]

Erfinder

SMITH DAVID D [US]

Externe Quellen

Klassifikation

IPC-Klassen
H01L 31/0216H01L 31/0236H01L 31/072H01L 31/0747H01L 31/18
CPC-Klassen
H10F 10/00H10F 10/10H10F 10/14H10F 10/146H10F 10/16H10F 10/165H10F 10/166H10F 71/00H10F 71/121H10F 71/1221H10F 77/122H10F 77/14H10F 77/147H10F 77/1642H10F 77/211H10F 77/219H10F 77/227H10F 77/311H10F 77/703H10F 77/707H10F 77/935
AI: SemiconductorsEnergy
warum

SunPower / Maxeon solar cell — H01L31. Semiconductors + Energy.

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